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Benchtop probe station
-190°C to 400°C Temperature Range
Gas purging and/or vacuum capabilities
Ø26mm inscribed hexagon sample area
4+ probes with remote mechanical positioning
HCP421V-PS1 Hot/Cold Modular Probing Station
Up to 6+ standard probers available
HP1000V-PS1 Benchtop Probe Station
Benchtop probe station
RT to 1000°C Temperature Range
Sealed chamber with gas purging and/or vacuum capabilities
13x13mm Sample Area
4+ independent electrical probes with remote mechanical positioning
Up to 6+ standard probers available
HP1000V-RF Extreme Environment RF/DC Probe Station
Advanced benchtop probe station
DC and RF Probing Capabilities
RT to 1000°C for DC, 800°C for RF
Modular vacuum chamber with optical access
TP104V-MPS+ // INS2301501 Motorized Wafer Probing Chamber
Customizable vacuum probing chamber
-40°C to 150°C without LN2
Supports wafer samples up to ø4"
Motorized XYZ sample positioning
6 independent overhead probers
TP102G-PM
Thermoelectric mini probe stage
-40°C to 150°C
40 mm × 40 mm sample area
4x independent electrical probes
Sealed chamber
HCP421V-PM
Mini electrical probe stage
-190°C - 400°C
Sealed chamber with vacuum capability
Compact design to fit on Raman, optical microscope, reflection FTIR microscope
Ø26 mm sample area (inscribed hexagon)
4 or 6 independent electrical probes
Optional triaxial connection for pA measurement
Optional additional feedthroughs
HCP621G-PM
Flagship mini electrical probe stage
-190°C - 600°C
Gas purging capability
Compact design to fit on Raman, optical microscope, reflection FTIR microscope
Ø26 mm sample area (inscribed hexagon)
Optional triaxial connection for pA measurement
Optional extra feedthrough
P02S-PM-XYZ4
Miniature benchtop probing station with precision XYZ prober control
No temperature control, no atmospheric control
4,6 or 8+ probers
50mm x 50mm elevated sample chuck with suction grooves
Compatible with 2" thermal chucks
P02S-PM
Ultra-Simplified miniature benchtop probing station
No temperature control, no atmospheric control
4, 6 or 8+ miniature electrical probers
50mm x 50mm elevated sample chuck
Inexpensive tool for benchtop probing
HP1000V-PM
Miniature high-temp probing stage
RT - 1000°C
13mm x 13mm
4x independent electrical probes
Sealed chamber
HCP621G-MP
Modular electrical probing stage
-190°C to 600°C with 26mm hexagonal sample area
Gastight chamber with optical access
4 or 6 electrical probers
Upgradable to fine XYZ micropositioning
HCP602SG-MP
Modular electrical probing stage
-190°C to 600°C with 2" sample area
Gastight chamber with optical access
4 or 6 electrical probers
Upgradable to fine XYZ micropositioning
HP1000V-MP
High-temperature probing station
RT to 1000°C
Four electrical feedthroughs for electrical Probers
Vacuum-tight chamber for rough vacuum or inert gas purge
Top and Bottom frame water-cooling
HP1000V-MPS Extreme Environment Probe Station
Extreme-environment probe station with compact footprint
Room Temperature up to 1000°C
Compatible with vacuum and atmospheric environments
13mm x 13mm (Option for 25mm x 25mm and 48mm x 48mm) square thermal block.
4+ independent electrical probes with remote mechanical positioning
Easy integration with modern instruments and optics
TP102V-MPS Thermoelectric Probe Station
Thermoelectric probe station with externally manipulated probers and vacuum/gas-purge capability
-40°C to 120°C standard temperature range (-40°C to 150°C available with optional upgrade) without the need for liquid nitrogen
Customizable number of probers, feedthroughs and temperature sensors
HCP421V-MPS Vacuum Chamber Probe Station
Tabletop design with small footprint integrates with modern instruments and benches
-190°C - 400°C (600°C option available, see HCP621G-MPS)
Ø26 mm hexagonal thermal block (optional upgrade for larger sample area available)
Sealed chamber with gas purging and/or vacuum capabilities
4+ independent electrical probes with remote mechanical positioning
Up to 6+ standard probers available (Ask about HCP421V-MPS6)
HP1000V-MPSH // INS2408589
Rt to 1000°C Hall effect Station
Integrated 0.5T permanent magnet with polarity reversal
Vacuum-tight chamber
External micromanipulator probers
H91 Hall Effect Measurement System
Complete Hall-effect measurment system
Options for temperature-controlled test cells
Features Lakeshore M91 Fasthall controller
0.5T permanent or electromagnets
HCP621G-PMH
Non-magnetic / Hall effect stage
38 mm × 42 mm sample area
Gas purging capability
4x independent electrical probes
-190°C - 600°C
Optional triaxial connections
Optional extra feedthrough
M06T Manual Hall Effect Station
Manually operated Hall Effect station compatible with INSTEC -PMH Hall effect probe stages
0.5 Tesla Neodymium magnet with reversable polarity
Rigid all-metal construction
PSM MINIATURE ANALYTICAL PROBE STATION
Compact & affordable design for research laboratory
Up to 6 inch wafer testing with 50um electrodes / PAD probes
Precision linear screw drives with zero back lash
LD/LED/PD light intensity / wavelength testing
IV/CV characteristic materials and device testing
PSE WAFER TESTING PROBE STATION
High magnification metallographic microscopy
Up to 12 inch wafer testing with 1um electrodes / PAD probes
LD/LED/PD Light intensity / wavelength testing IV/CV
High frequency testing to 300GHz
TP104V-MPS+ // INS2301501 Motorized Wafer Probing Chamber
Customizable vacuum probing chamber
-40°C to 150°C without LN2
Supports wafer samples up to ø4"
Motorized XYZ sample positioning
6 independent overhead probers
PSH COMPREHENSIVE ANALYTICAL PROBE STATION
Stable structure with quick-lifted and fine-tuned Platen
Suitable for probe card installation and usage
Compatible with high magnification metallographic microscope
Up to 12 inch wafer testing
Precision linear screw drives with zero back lash
Internal circuit / electrode / PAD probe