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High Temperature RF Probing Chamber HP1000V-MPS+
Customizable vacuum probing chamber
Room temp to 1000°C
Independent DC and RF 50Ghz overhead probers
Supports samples up to 50mm x 50mm
XYZR sample positioning
HP1000V-MPS
High temperature 1000C probing station with external prober micromanipulators and gas purge or vacuum chamber
TP104V-MPS+ // INS2301501
Customizable vacuum probing chamber
-40°C to 150°C without LN2
Supports wafer samples up to ø4"
Motorized XYZ sample positioning
6 independent overhead probers
TP102V-MPS Thermoelectric Probe Station
Thermoelectric probe station with externally manipulated probers and vacuum/gas-purge capability.
-25°C to 120°C standard temperature range (-40°C to 160°C available with optional upgrade) without the need for liquid nitrogen.
Customizable number of probers, feedthroughs and temperature sensors
HCP421V-MPS Vacuum Chamber Probe Station
Tabletop design with small footprint integrates with modern instruments and benches
-190°C - 400°C (600°C option available, see HCP621G-MPS)
Fits up to Ø26 mm hexagonal thermal block (optional upgrade for larrger sample area available)
Sealed chamber with gas purging and/or vacuum capabilities
4+ independent electrical probes with remote mechanical positioning
Up to 7 probers available
VACUUM BENCHTOP PROBE STATIONS
Tabletop vacuum probe stage
Variable sample size
Gas purging or vacuum capability
4 remote positioning electrical probes
-190°C - 1000°C
TP102G-PM
Thermoelectric mini probe stage
-40°C to 150°C
40 mm × 40 mm sample area
4x independent electrical probes
Sealed chamber
HCP421V-PM
Mini electrical probe stage
-190°C - 400°C
Sealed chamber with vacuum capability
Compact design to fit on Raman, optical microscope, reflection FTIR microscope
28 mm × 30 mm sample area
4 independent electrical probes
Optional triaxial connection for pA measurement
Optional additional feedthroughs
HCP621G-PM
Flagship mini electrical probe stage
-190°C - 600°C
Gas purging capability
Compact design to fit on Raman, optical microscope, reflection FTIR microscope
28 mm × 30 mm sample area
Optional triaxial connection for pA measurement
Optional extra feedthrough
P02S-PM-XYZ4
Miniature benchtop probing station with precision XYZ prober control
No temperature control, no atmospheric control
4,6 or 8+ probers
Ø50mm elevated sample area
P02S-PM
Ultra-Simplified miniature benchtop probing station
No temperature control, no atmospheric control
4, 6 or 8+ miniature electrical probers
Ø50mm elevated sample area
Inexpensive tool for benchtop probing
HP1000V-PM
Miniature high-temp probing stage
RT - 1000°C
25 mm × 25 mm sample area
4x independent electrical probes
Sealed chamber
H91 Hall Effect Measurement System
HCP621G-PMH
Non-magnetic / Hall effect stage
38 mm × 40 mm sample area
Gas purging capability
4x independent electrical probes
-190°C - 600°C
Optional triaxial connections
Optional extra feedthrough
M06T Manual Hall Effect Station
Manually operated Hall Effect station compatible with INSTEC -PMH Hall effect probe stages
0.5 Tesla Neodymium magnet with reversable polarity
Rigid all-metal construction
PSM MINIATURE ANALYTICAL PROBE STATION
Compact & affordable design for research laboratory
Up to 6 inch wafer testing with 50um electrodes / PAD probes
Precision linear screw drives with zero back lash
LD/LED/PD light intensity / wavelength testing
IV/CV characteristic materials and device testing
PSE WAFER TESTING PROBE STATION
High magnification metallographic microscopy
Up to 12 inch wafer testing with 1um electrodes / PAD probes
LD/LED/PD Light intensity / wavelength testing IV/CV
High frequency testing to 300GHz
TP104V-MPS+ // INS2301501
Customizable vacuum probing chamber
-40°C to 150°C without LN2
Supports wafer samples up to ø4"
Motorized XYZ sample positioning
6 independent overhead probers
PSH COMPREHENSIVE ANALYTICAL PROBE STATION
Stable structure with quick-lifted and fine-tuned Platen
Suitable for probe card installation and usage
Compatible with high magnification metallographic microscope
Up to 12 inch wafer testing
Precision linear screw drives with zero back lash
Internal circuit / electrode / PAD probe