- HOME
-
PRODUCTS
-
ELECTRICAL PROBE SYSTEMS
- ANALYTICAL PROBE STATIONS
- BENCHTOP PROBE STATIONS
- STANDARD MINI PROBE STAGES
- SPECIALTY MINI PROBE STAGES
- WAFER CHUCKS
-
THERMAL PLATES
- BENCHTOP THERMAL PLATES
- COMPACT THERMAL PLATES
- SPECIALTY THERMAL PLATES
- HALL EFFECT MEASURMENT
- ELECTRONICS PRODUCTS
- CONTROLLERS, COOLING SYSTEMS AND ACCESSORIES
- OPTICAL EQUIPMENT
-
LIQUID CRYSTAL SYSTEMS
- ALCT SYSTEM
- LC SYSTEM ACCESSORIES
- LC MATERIALS
- CUSTOM PRODUCTS
RESOURCES
SUPPORT
ABOUT
-
-
-
Tabletop design with small footprint integrates with modern instruments and benches
-190°C - 400°C (600°C option available, see HCP621G-MPS)
Ø26 mm hexagonal thermal block (optional upgrade for larger sample area available)
Sealed chamber with gas purging and/or vacuum capabilities
4+ independent electrical probes with remote mechanical positioning
Up to 6+ standard probers available (Ask about HCP421V-MPS6)
HCP421V-MPS Vacuum Chamber Probe Station
PRODUCT INQUIRY -
-
DESCRIPTION
The HCP421V-MPS is a compact benchtop probing station with modular components that can be customized for nearly an application. The base model includes a 421 heating and cooling core, capable of precision temperature control from -190C to 400C under vacuum or ambient conditions. 4 independent electrical probers are controlled via micrometer dials for XYZ prober control even when the chamber is sealed and under vacuum.
The 45mm diameter viewing aperture on the chamber lid provides excellent optical access of the entire sample area, and is comptatible with a wide range of optical analysis tools. The HCP421V-MPS can even be mounted directly to an upright microscope to add temperature control, atmospheric control and electrical probing capabilities into a single instrument.
Upgrade to the HCP421V-MPS+ fully customizable model to add or remove probers, change electrical feedthrough types, add RF probers with rotational control, high vacuum compatability, larger sample areas and more!
For more information on INSTEC probing solutions, check out our full Electrical Probing Solutions Catalog!
Note: All images and specifications are for reference only, and are subject to change at any time without notice. Always confirm final technical specifications with our sales team before placing an official order.
-
THERMAL FEATURES
Temperature Control
mK2000 with programmable precision LVDC PID method to minimize electrical noise
Thermal Block
Silver
Temperature Minimum
-190°C (with optional liquid N2 cooling)
Temperature Maximum
400°C for vacuum version (600°C for gas tight version)
Temperature Sensor
100 Ω Platinum RTD
Maximium Heating/ Cooling Rate
±30°C/min
*Up to +150°C/min available by request
Minimum Heating/ Cooling rate
±0.01°C/min
Temperature Resolution
0.01°C (RTD)
Temperature Stability
±0.05°C (>25°C), ±0.1°C (<25°C)
Power Supply Universal power input - 200W max (not including LN2 system or water cooling accessory) Software
Windows 10/11 software to record and export temperature-time data
SCPI interface with programming SDK avialable
-
OPTICAL FEATURES
Optical Access
Reflection only (transmission option available with + model)
Optical Windows
Removable and exchangeable windows permit full-spectrum transparency
Window options include Soda-lime, quartz (default), CaF2, etc...
Minimum Objective Working Distance
12 mm
Top Aperture
Ø45mm aperture with Ø50mm window
Top Viewing Angle
±50° from normal
Window Defrost
External window defrosting fixture
-
STRUCTURAL FEATURES
Sample Area
Ø26mm diameter inscribed hexagon (50mm x 50mm option available, contact us about the HCP402SV-MPS)
Chamber Height
8mm, maximium reccomended sample thickness of 3mm
Sample Access Quick-access cover with spring-loaded thumbscrew
Optional sample clips available for improved thermal contact, or for vertical mounting
Atmosphere Control
Supports evacuation down to at least 9.9*10^-3 mBar
Supports positive pressure gas purge up to +0.5 Bar to control humidity, condensation, and oxidation
Includes 1x stainless steel vacuum bellows + 1x machinable aluminum blank by default. Secondary vacuum bellows available by request.
Mounting Horizontal or Vertical mounting capability. Base model includes tapped holes on frame and removable side-mounted L-Brackets. Horizontal mounting adaptors available for select instruments, or by custom design
Baseplate for tube microscope available by request
Frame Cooling Integrated frame cooling with optional chiller system
Frame Dimensions
300 mm x 300 mm x 40 mm
Weight
4000g
-
ELECTRICAL FEATURES
Electrical Probes
Four (4) DC to 500MHz electrical probes (200V/1A Max)
- Prober material options such as tungsten-rhenium, beryllium-copper, or other materials
- 25um or 5um tip radius options
- Additional standalone electrical feedthroughs available by request
Probe Positioning
XYZ micro positioners remotely manipulate probes within sealed sample chamber with >10um resolution. Ideal for pad sizes larger than 10 um x 10 um*
*Smaller pad sizes require -PS series
Connectors
Coaxial BNC connectors for HCP421V-PM base-model (native SMA connectors with SMA to BNC adaptor pre-installed)
Floating, triaxial or SMA connectors available with HCP421V-MPS+ model
Sample Surface
Electrically grounded sample area*
(*Floating or triaxial options for back-biasing available with HCP421V-MPS+ customizable model)
-
Prober Demonstration