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HCS350G-TNS
Tensile Force Measurement Stage
Measure changes in-situ
-190℃ - 300℃
HP600G-XRD
High temperature thermal stage with LN2 cooling specially design for x-ray measurements. X-ray diffraction and beamline configurations allow for easy use with most systems. Curved kapton window design allows for x-ray measurements over a broad range of diffraction angles.
HCS621GXY-GEO
Microscopy stage for geology
-190°C - 600°C
28 mm × 30 mm sample area
sample side-loading
XY sample positioning
Gas tight
HCS601G-IRM
Wide angle IR-specific stage
24 mm × 24 mm sample area
-190°C - 600°C
CLM77Ki
For correlative cryo-light (inverted) and cryo-electron microscopy (CLEM)
-190°C - 150°C
Supports 3x3 EM grids, up to 3mm diameter each
Designed for vitreous operation
CLM77K
For correlative cryo-light (upright) and cryo-electron microscopy (CLEM)
-190°C - 150°C
Allows nine EM grids, 3 mm round
designed for vitreous operation
HCS601GXY-IRM
Wide angle IR-specific stage
24 mm × 24 mm sample area
XY sample positioning & gas purging capability
-190°C - 600°C