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Customizable vacuum probing chamber
Room temp to 1000°C
Independent DC and RF 50Ghz overhead probers
Supports samples up to 50mm x 50mm
XYZR sample positioning
High temperature 1000C probing station with external prober micromanipulators and gas purge or vacuum chamber
Customizable vacuum probing chamber
-40°C to 150°C without LN2
Supports wafer samples up to ø4"
Motorized XYZ sample positioning
6 independent overhead probers
Thermoelectric probe station with externally manipulated probers and vacuum/gas-purge capability
-40°C to 120°C standard temperature range (-40°C to 150°C available with optional upgrade) without the need for liquid nitrogen
Customizable number of probers, feedthroughs and temperature sensors
Tabletop design with small footprint integrates with modern instruments and benches
-190°C - 400°C (600°C option available, see HCP621G-MPS)
Ø26 mm hexagonal thermal block (optional upgrade for larger sample area available)
Sealed chamber with gas purging and/or vacuum capabilities
4+ independent electrical probes with remote mechanical positioning
Up to 6+ standard probers available (Ask about HCP421V-MPS6)
Tabletop vacuum probe stage
Variable sample size
Gas purging or vacuum capability
4 remote positioning electrical probes
-190°C - 1000°C