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Benchtop probe station
-190°C to 400°C Temperature Range
Gas purging and/or vacuum capabilities
Ø26mm inscribed hexagon sample area
4+ probes with remote mechanical positioning
HCP421V-PS1 Hot/Cold Modular Probing Station
Up to 6+ standard probers available
HP1000V-PS1 Benchtop Probe Station
Benchtop probe station
RT to 1000°C Temperature Range
Sealed chamber with gas purging and/or vacuum capabilities
13x13mm Sample Area
4+ independent electrical probes with remote mechanical positioning
Up to 6+ standard probers available
HP1000V-RF Extreme Environment RF/DC Probe Station
Advanced benchtop probe station
DC and RF Probing Capabilities
RT to 1000°C for DC, 800°C for RF
Modular vacuum chamber with optical access
TP104V-MPS+ // INS2301501 Motorized Wafer Probing Chamber
Customizable vacuum probing chamber
-40°C to 150°C without LN2
Supports wafer samples up to ø4"
Motorized XYZ sample positioning
6 independent overhead probers