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HP1000V-PSRF Extreme Environment RF/DC Probe Station
Advanced benchtop probe station
DC and RF Probing Capabilities
RT to 1000°C for DC, 800°C for RF
Modular vacuum chamber with optical access
HP1000V-MPS Extreme Environment Benchtop Probe Station
Extreme-environment probe station with compact benchtop footprint
Room Temperature up to 1000°C
Compatible with vacuum and atmospheric environments
13mm x 13mm (Option for 25mm x 25mm and 48mm x 48mm) square thermal block.
4+ independent electrical probes with remote mechanical positioning
Easy integration with modern instruments and optics
TP104V-MPS+ // INS2301501 Motorized Wafer Probing Chamber
Customizable vacuum probing chamber
-40°C to 150°C without LN2
Supports wafer samples up to ø4"
Motorized XYZ sample positioning
6 independent overhead probers
TP102V-MPS Thermoelectric Probe Station
Thermoelectric probe station with externally manipulated probers and vacuum/gas-purge capability
-40°C to 120°C standard temperature range (-40°C to 150°C available with optional upgrade) without the need for liquid nitrogen
Customizable number of probers, feedthroughs and temperature sensors
HCP421V-MPS Vacuum Chamber Probe Station
Tabletop design with small footprint integrates with modern instruments and benches
-190°C - 400°C (600°C option available, see HCP621G-MPS)
Ø26 mm hexagonal thermal block (optional upgrade for larger sample area available)
Sealed chamber with gas purging and/or vacuum capabilities
4+ independent electrical probes with remote mechanical positioning
Up to 6+ standard probers available (Ask about HCP421V-MPS6)
VACUUM BENCHTOP PROBE STATIONS
Tabletop vacuum probe stage
Variable sample size
Gas purging or vacuum capability
4 remote positioning electrical probes
-190°C - 1000°C