- HOME
-
PRODUCTS
-
ELECTRICAL PROBE SYSTEMS
- ANALYTICAL PROBE STATIONS
- BENCHTOP PROBE STATIONS
- STANDARD MINI PROBE STAGES
- SPECIALTY MINI PROBE STAGES
- WAFER CHUCKS
-
THERMAL PLATES
- BENCHTOP THERMAL PLATES
- COMPACT THERMAL PLATES
- SPECIALTY THERMAL PLATES
- HALL EFFECT MEASURMENT
- ELECTRONICS PRODUCTS
- CONTROLLERS, COOLING SYSTEMS AND ACCESSORIES
- OPTICAL EQUIPMENT
-
LIQUID CRYSTAL SYSTEMS
- ALCT SYSTEM
- LC SYSTEM ACCESSORIES
- LC MATERIALS
- CUSTOM PRODUCTS
RESOURCES
SUPPORT
ABOUT
PRODUCT INQUIRY-
Description
The HP1000V-MPS is a compact benchtop probing station with modular components that can be customized for nearly any application. The base model includes a 1000°C heating core, capable of precision temperature control under vacuum or ambient conditions. 4 independent electrical probers are controlled via micrometer dials for XYZ prober control even when the chamber is sealed and under vacuum.
The 45mm viewing aperture on the chamber lid provides excellent optical access of the entire sample area, and is compatible with a wide range of optical analysis tools. The HP1000V-MPS can even be mounted directly to an upright microscope to add temperature control, atmospheric control, and electrical probing capabilities into a single instrument.
Upgrade to the HP1000V-MPS+ fully customizable model to add or remove probers, change electrical feedthrough types, add RF probers with rotational control, high vacuum compatibility, larger sample areas and more!
For more information on INSTEC probing solutions, check out our full Electrical Probing Solutions Catalog!
-
Thermal Features
Temperature Control
mK2000 with programmable precision LVDC PID method to minimize electrical noise
Thermal Block
Silicon Carbide
Temperature Minimum
Ambient temperature, active cooling of the sample is not supported
Temperature Maximum
1000°C in vacuum, gaspurge, or ambient air envrionment
Temperature Sensor
S-type Thermocouple
Temperature Resolution
0.1°C (Thermocouple)
Temperature Stability
±0.1°C (>25°C)
Software
Windows software to record and export temperature-time data
-
Electrical Prober Features
Electrical Probes
Standard tungsten-rhenium DC probes with other probe options available
Probe Positioning
XYZ micro positioners remotely manipulate probes within sealed sample chambers with 10um resolution
Connectors
BNC connector (default) or triaxial BNC connectors
Sample Surface
Grounded (default), floating, or triaxial options upon request
-
Optical Features
Optical Access
Reflection (transmission option available)
Optical Windows
Removable and exchangeable windows permit full-spectrum transparency
Minimum Objective Working Distance
12mm
Top Aperture
Ø38mm, with Ø42mm window
Top Viewing Angle
±50° from normal
Window Defrost
Integrated external window defrost
-
Structural Features
Sample Area
20mm x 20mm (Ø50mm option available, contact sales@instec.com)
Chamber Height
8mm
Atmosphere Control
Gas purging or vacuum capability to control humidity, condensation, and oxidation
Frame Cooling
Integrated frame cooling with optional chiller system
Frame Dimensions
300 mm x 300 mm x 40 mm
Weight
4000g