PRODUCTS
ELECTRICAL PROBE SYSTEMS
THERMAL PLATES
LIQUID CRYSTAL SYSTEMS
RESOURCES
SUPPORT
ABOUT
High T microscopy & spectroscopy
16mm x 16mm sample area
Gas purging capability
30°C - 1150°C
High temperature stage
Rotating sample observation window
30°C - 1500°C
Ø 7.5mm sample area
Gas-tight
For long duration experiments
-40°C - 120°C
Sealed chamber with gas purging or vacuum capability
Compact Thermal Plate for microscopy and spectroscopy
-190°C to 600°C
Ø26 mm hexagonal sample area
Sealed chamber with gas purging capability
Reflection stage for microscopy & spectroscopy
Ø26 mm hexagonal sample area
Vacuum-tight chamber
-190°C to 400°C