- HOME
-
PRODUCTS
-
ELECTRICAL PROBE SYSTEMS
- ANALYTICAL PROBE STATIONS
- BENCHTOP PROBE STATIONS
- STANDARD MINI PROBE STAGES
- SPECIALTY MINI PROBE STAGES
- WAFER CHUCKS
-
THERMAL PLATES
- BENCHTOP THERMAL PLATES
- COMPACT THERMAL PLATES
- SPECIALTY THERMAL PLATES
- HALL EFFECT MEASURMENT
- ELECTRONICS PRODUCTS
- CONTROLLERS, COOLING SYSTEMS AND ACCESSORIES
- OPTICAL EQUIPMENT
-
LIQUID CRYSTAL SYSTEMS
- ALCT SYSTEM
- LC SYSTEM ACCESSORIES
- LC MATERIALS
- CUSTOM PRODUCTS
RESOURCES
SUPPORT
ABOUT
HP1200G
High T microscopy & spectroscopy
Ø 12mm sample area
Gas purging capability
30°C - 1200°C
HP1500G
High temperature stage
Rotating sample observation window
30°C - 1500°C
Ø 7.5mm sample area
Gas-tight
TP102G
For long duration experiments
-40°C - 120°C
Sealed chamber with gas purging or vacuum capability
HCP621G
Ideal for Raman microscopy and spectroscopy
-190°C - 600°C
Ø30 mm sample area
Sealed chamber with gas purging capability
HCP421V
Reflection stage for microscopy & spectroscopy
Ø30 mm sample area
Vacuum-tight chamber
-190°C - 400°C