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Miniature benchtop probing station with precision XYZ prober control
No temperature control, no atmospheric control (Optional upgrade to thermal chuck available)
4,6 or 8+ probers, ideal for pads larger than 50um x 50um
Ø50mm elevated sample area
Cost-effective substitute for full-size probe station
Optional upgrades including electrically floating surface area, sample clips or sample suction grooves, transmisison aperture and much more!
P02S-PM-XYZ4
PRODUCT INQUIRY -
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DESCRIPTION
The P02S-PM-XYZ4 is a simple but robust benchtop probing tool for a variety of applications. Designed to essentially be a super-miniatureized probe station, the XYZ4 is a cost and space effective solution for electrical characterization and testing of singulated semiconductor devices or material samples.
This simplified probe station does not have any active temperature control or atmospheric control and instead focuses on reliability and simplicity. The P02S-PM supports 4, 6 or *8+ electrical probers, each of which can be precisley positioned via XYZ micromanipulators. The entire probing station is thin enough to be placed under an optical microscope or within a magnetic field for Van Der pauw or Hall-bar hall-effect measurements, making it a simple yet versatile tool.
*8+ Probers requires the P02S-PM+ customizable model
The standard P02S-PM-XYZ4 comes with 1 tungsten-rhenium probe tip (50um tip diameter) and one Coaxial BNC connection per electrical prober. Complete coaxial cables are not included.
The upgraded P02S-PM-XYZ4+ model can be customized to include a range of additional features such as more than 8+ prober options, custom prober layouts, specialized probers such as RF or 4-point, transmission apertures, additional mounting holes, handles, non-magnetic construction for Hall Effect measurments, electrical connections, sample suction grooves, electrically floating sample area and more!
Contact sales@instec.com for more information, and to find out how the P02S-PM-XYZ4 can improve your experiment!
For more information on INSTEC probing solutions, check out our full Electrical Probing Solutions Catalog!
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FEATURES
Temperature Control
No active temperature control
Optional support for Instec thermal plates/ chucks
available by request
Frame Material
Anodized Aluminum
(Option for Gold, Nickel or Zinc plating
with P02S-PM-XYZ4+ model)
Probe Positioning
Precision XYZ micropositioners.
10mm x 10mm x 10mm fine adjustment range,
10um resolution.
10mm rough adjustment range on prober arm, 10mm rough
adjustment on micropositioner base.
Probers can reach anywhere within 20mm radius from the
center of sample area.
4, 6 or 8+ prober options available
Connectors
Female Coaxial BNC connectors
250V 0.5W Maximum
Reccomended for DC to 500 MHz signals
Electrically biased
surface area
Grounded sample area
(Option for electrically floating
surface area/ back-bias with P02S-PM-XYZ4+)
Optical Access
Optical access to sample via reflection
(Option to add transmission aperture from 2mm to 20mm with P02S-PM-XYZ4+)
Sample Area
Ø50mm on removable sample block
Up to 4x spring-loaded sample clips
Atmosphere Control
None
Frame Cooling
None
Mounting
4x through-holes
Frame Dimensions
140mm x 320mm x 23mm (thickness without sample,
measured across center)