- HOME
-
PRODUCTS
-
ELECTRICAL PROBE SYSTEMS
- ANALYTICAL PROBE STATIONS
- BENCHTOP PROBE STATIONS
- STANDARD MINI PROBE STAGES
- SPECIALTY MINI PROBE STAGES
- WAFER CHUCKS
-
THERMAL PLATES
- BENCHTOP THERMAL PLATES
- COMPACT THERMAL PLATES
- SPECIALTY THERMAL PLATES
- HALL EFFECT MEASURMENT
- ELECTRONICS PRODUCTS
- CONTROLLERS, COOLING SYSTEMS AND ACCESSORIES
- OPTICAL EQUIPMENT
-
LIQUID CRYSTAL SYSTEMS
- ALCT SYSTEM
- LC SYSTEM ACCESSORIES
- LC MATERIALS
- CUSTOM PRODUCTS
RESOURCES
SUPPORT
ABOUT
PRODUCT INQUIRY-
DESCRIPTION
The P02S-PM is a simple but robust benchtop probing tool for a variety of applications. Designed to be an affordable alternative to our temperature-controlled -PM products, this simplified probe station does not have any active temperature control or atmospheric control and instead focuses on reliability and simplicity. The P02S-PM supports 4, 6 or *8+ electrical probers, each of which can be manually positioned on the sample - perfect for vander-pauw, 4-point probe, or hall-bar measurements. The entire probing station is thin enough to be placed under an optical microscope or within a magnetic field for hall-effect measurements, making it a simple yet versatile tool.
*8+ Probers requires the P02S-PM+ customizable model
The standard P02S-PM comes with 1 tungsten-rhenium probe tip and one Coaxial BNC per electrical prober. Complete coaxial cables are not included.
The upgraded P02S-PM+ model can be customized to include a range of additional features such as more than 8+ prober options, custom prober layouts, specialized probers such as RF or 4-point, transmission apertures, additional mounting holes, handles, non-magnetic construction for Hall Effect measurments, electrical connections, and more!
Contact sales@instec.com for more information, and to find out how the P02S-PM can improve your experiment!
For more information on INSTEC probing solutions, check out our full Electrical Probing Solutions Catalog!
-
FEATURES
Temperature Control
No active temperature control
Frame Material
Anodized Aluminum (Option for Gold, Nickel or Zinc plating
with P02S-PM+ model)
Probe Positioning
Manual cantilever probes independently positionable to any
point of the sample area. 4, 6 or 8+ prober options available.
Ideal for pad sizes larger than 600 um x 600 um*
*Smaller pad sizes require -MP or -MPS models
Connectors
Female Coaxial BNC connectors
Prober assemblies can be removed and used as
straight wired connections
Electrically biased surface area
Grounded sample area (Option for electrically floating
surface area/ back-bias with P02S-PM+)
Optical Access
Optical access to sample via reflection (Option to add
transmission aperture from 2mm to 20mm with P02S-PM+)
Sample Area
Ø50mm on removable sample block
Atmosphere Control
None
Frame Cooling
None
Mounting
4x through-holes
Frame Dimensions
177mm x 160mm x 15mm (thickness without sample)