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Automatic Liquid Crystal Test Systems
Full range of liquid crystal physical property measurements including splay and bend elastic constants, threshold voltage, and dielectric constants for both positive and negative anisotropic nematic liquid crystal materials
Quick, convenient, small-volume, bench-top measurements are reported to any Windows PC using the USB communication port and can be readily analyzed with the included WinLC software
Compatible with all INSTEC LC cells, holders, optical accessories, and temperature control sample stages
ALCT SELECTION GUIDE
PRODUCT INQUIRY -
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ALCT MEASUREMENT PRINCIPLES
A detailed explanation of ALCT measurement principles is found in our comprehensive brochure.
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SELECTION GUIDE
In this selection guide, you will find a list of available measurements along with corresponding ALCT models which perform them. Instec ALCTE-*** configurations are available for each of the models below to academic customers only. These models offer the same or similar functionality as their industrial ALCT-*** counterparts, but at a reduced cost to help facilitate growth in fundamental liquid crystal research. Many of the features below can be ordered as single-feature systems, or selected together to create a customized configuration. Contact Instec with your requirements.
ALCT-PP1
ALCTE-
PP1
ALCT-K22-1
ALCT-PG1
ALCT-NG1
ALCT-FLC1
ALCT-E01S
ALCT-
IV1
ALCT-IV1-nC
ALCT-IR1-nC
ALCT-HR1
ALCT-FFSIPS
POSITIVE DIELECTRIC ANISOTROPIC NLC
Threshold Voltage
✔
✔
Splay & Bend Elastic Constants, K11 & K33
✔
✔
Twist Elastic Constant, K22
✔
εꞱ and ε‖ Dielectric Constants
✔
✔
Rotational Viscosity, Υ1
✔
✔
NEGATIVE DIELECTRIC ANISOTROPIC NLC
Threshold Voltage
✔
✔
Splay & Bend Elastic Constants, K11 & K33
✔
✔
Twist Elastic Constant, K22
✔
εꞱ and ε‖ Dielectric Constants
✔
✔
Rotational Viscosity, Υ1
✔
FLC
Spontaneous Polarization
✔
✔
Electrical Switching Time
✔
✔
Rotational Viscosity
✔
✔
Ion Density and Mobility
✔
✔
Electrical Resistivity
✔
✔
Dielectric Constant
✔
✔
Electro-optic Response
✔
LCD QUALITY CONTROL MEASUREMENTS
Ion Density
✔
✔
✔
✔
Voltage Holding Ratio (VHR)
✔
✔
✔
✔
Residual DC (RDC)
✔
✔
✔
✔
Resistivity (High Resistance)
✔
Configurable for Multi-channel (up to 16) Measurements
✔ ✔
✔ ✔
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HARDWARE SPECIFICATIONS
These specifications are common to all standard ALCT instruments. Systems are configured with selected measurement options made available in WinLC software at time of order.
ION CHARGE
Minimum Output Voltage
± 10 mV
Maximum Output Voltage
± 10 V
Resolution
100 μV
Frequency
0.001 - 1000 Hz
Current Range
100 pA - 1 mA
Current Resolution
0.5 pA
Current Sensing Resistance
1 kΩ - 10 GΩ
Post Gain
1x, 10x, 100x, 1000x
VHR / RDC MEASUREMENT
Minimum Voltage
± 10 mV
Maximum Voltage
± 10 V
Resolution
100 μV
Maximum Output Current
± 100 mA
Offset Voltage
± 0.1 mV
Input Capacitance (Hold Mode)
< 1 pF
Leak Current (Hold Mode)
< 0.5 pA
V0 Offset (Hold Mode)
± 0.1 mV
Charge Injection
± 5 pC
CV CURVE / ROTATIONAL VISCOSITY
Output Wave
DC to 2 kHz, 0 - ± 100 V
Output Update Rate
500 kHz
Output Resolution
16 bit
Input Resolution
16 bit
Input Sample Rate
2 MHz
Current Measurement Range
1 nA - 1 mA
Current Sensing Resistance
1 kΩ - 100 kΩ
Current Resolution
100 pA
Post Gain
1x, 10x, 100x, 1000x
Capacitance Measurement
2 pF - 10 nF
DC RESISTIVITY
Minimum Voltage
± 10 mV
Maximum Voltage
± 100 V
Resolution
100 μV
Measurement Resistivity Range
Up to 1016 Ω cm
GENERAL SPECIFICATIONS
Operation Temperature
15°C - 35°C
Input Line
100 - 120 V AC or 200 - 240 V AC, 50 / 60 Hz, 2 A
Dimensions
1 - 4 channels: 14.5 x 15 x 7 inches
5 - 8 channels: 19.5 x 15 x 7 inches
Optional Sample Temperature Control
(1) Oven option
(2) Custom hot plate with mK2000 controller
ALCT specifications subject to change as new hardware revisions become available.