PRODUCTS
ELECTRICAL PROBE SYSTEMS
THERMAL PLATES
LIQUID CRYSTAL SYSTEMS
RESOURCES
SUPPORT
ABOUT
Square sample area to accommodate various sample sizes and shapes
Better integrate into some experimental workspaces
S (grounded), SF (floating), or ST (triaxial) options
Multi vacuum zones for different wafer sizes
Optional cooling down to 80K
Optional triaxial for pA current measurements
Surface Options |
Standard: clear anodized aluminum Optional: nickel, zinc, or gold plating |
Wafer Vacuum Control |
Independent vacuum channels Custom vacuum holes available |
Lift Pin |
Optional |
Base Cooling |
Integrated base cooling via hose barb ports with optional chiller system |
Mounting |
Probe station mounting capability Custom adapter options |
Surface Electrical Options |
grounded (S), floating (SF), or triaxial (ST) surfaces |
BNC Connector Options |
Coaxial, floating, or triaxial BNC |
Temperature Control |
mK2000 with programmable precision switching PID method Optional LVDC PID method to minimize electrical noise |
Temperature Sensor |
100 Ω Platinum RTD |
Temperature Resolution |
0.01°C |
Temperature Stability |
±0.05°C (>25°C) and ±0.1°C (<25°C) |
Temperature Uniformity |
±2% or better |
Power Supply |
115 V or 230 V depending on region |
Software |
Windows software to record and export temperature-time data |
Model |
Size Square |
Fits Samples |
Weight(kg) |
Temperature Range |
Maximum Rate at 100°C |
|||
MIN |
MAX |
MIN |
MAX |
Heating |
Cooling |
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HCC602S | 55mm | 3mm | 50mm | 0.4 | -190°C |
600°C |
+30°C / min | -10°C / min |
HCC212/312S |
55 mm |
8mm |
50mm |
0.4 |
-190°C |
200/300°C |
+30°C / min |
-10°C / min |
HCC214/314S |
105 mm |
15mm |
100mm |
1.2 |
-120°C |
200/300°C |
+30°C / min |
-20°C / min |
HCC216/316S |
155 mm |
40mm |
150mm |
3.0 |
-100°C |
200/300°C |
+30°C / min |
-10°C / min |
HCC218/318S |
205 mm |
40mm |
200mm |
5.0 |
-80°C |
200/300°C |
+10°C / min |
-5°C / min |