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Probing Systems
Instec’s series of hot and cold probing systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range. Instec probing systems are the ideal solution for converting an existing inspection microscope or optical test setup into a precision temperature-controlled semiconductor testing and qualification station. 
 
 
Hot and Cold Probing Plates - Instec's Hot and Cold Probing Plates offer a compact design for temperature-controlled measurements. Four tungsten-rhenium probes are mounted on magnetic bases for easy positioning. 
 
 
 
 
Hot and Cold Probing Stations - Instec’s Hot and Cold Probing Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.
 
 
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